The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces

Daniel J. Gianoli, Sean S. Kohles, Nancy A. Burnham, Melissa B. Clark, Christopher A. Brown, James N. Kenealy

Research output: Contribution to conferencePaper

1 Scopus citations

Abstract

The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.

Original languageEnglish (US)
Pages5-6
Number of pages2
StatePublished - Dec 1 2001
Event27th IEEE Annual Northeast Bioengineering Conference - Storrs, CT, United States
Duration: Mar 31 2001Apr 1 2001

Other

Other27th IEEE Annual Northeast Bioengineering Conference
CountryUnited States
CityStorrs, CT
Period3/31/014/1/01

ASJC Scopus subject areas

  • Bioengineering

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    Gianoli, D. J., Kohles, S. S., Burnham, N. A., Clark, M. B., Brown, C. A., & Kenealy, J. N. (2001). The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces. 5-6. Paper presented at 27th IEEE Annual Northeast Bioengineering Conference, Storrs, CT, United States.