The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces

The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.