The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces

Daniel J. Gianoli; Sean S. Kohles; Nancy A. Burnham; Melissa B. Clark; Christopher A. Brown; James N. Kenealy

The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces

Daniel J. Gianoli, Sean S. Kohles, Nancy A. Burnham, Melissa B. Clark, Christopher A. Brown, James N. Kenealy

Restorative Dentistry

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.

Original language	English (US)
Pages	5-6
Number of pages	2
State	Published - Dec 1 2001
Event	27th IEEE Annual Northeast Bioengineering Conference - Storrs, CT, United States Duration: Mar 31 2001 → Apr 1 2001

Other

Other	27th IEEE Annual Northeast Bioengineering Conference
Country	United States
City	Storrs, CT
Period	3/31/01 → 4/1/01

ASJC Scopus subject areas

Bioengineering

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The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces. / Gianoli, Daniel J.; Kohles, Sean S.; Burnham, Nancy A.; Clark, Melissa B.; Brown, Christopher A.; Kenealy, James N.

2001. 5-6 Paper presented at 27th IEEE Annual Northeast Bioengineering Conference, Storrs, CT, United States.

Research output: Contribution to conference › Paper › peer-review

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abstract = "The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.",

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AU - Gianoli, Daniel J.

AU - Kohles, Sean S.

AU - Burnham, Nancy A.

AU - Clark, Melissa B.

AU - Brown, Christopher A.

AU - Kenealy, James N.

PY - 2001/12/1

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AB - The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.

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