TY - JOUR
T1 - The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces
AU - Gianoli, Daniel J.
AU - Kohles, Sean S.
AU - Burnham, Nancy A.
AU - Clark, Melissa B.
AU - Brown, Christopher A.
AU - Kenealy, James N.
PY - 2001
Y1 - 2001
N2 - The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.
AB - The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.
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M3 - Conference article
AN - SCOPUS:0035784230
SP - 5
EP - 6
JO - Proceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC
JF - Proceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC
SN - 1071-121X
T2 - 27th IEEE Annual Northeast Bioengineering Conference
Y2 - 31 March 2001 through 1 April 2001
ER -