Abstract
The feasibility of using the atomic force microscope (AFM) to locate individual cells on a roughened implant surface, and detach an adhered cell while measuring reaction forces was explored. Test samples from four different types of implant surfaces were prepared from commercially pure titanium (CPTi). These surface preparations included: machined, acid- etched (Osseotite), titanium plasma spray coated (TPS), and hydroxyapatite coated (HA). Preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the four surface preparations.
Original language | English (US) |
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Pages (from-to) | 5-6 |
Number of pages | 2 |
Journal | Proceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC |
State | Published - 2001 |
Externally published | Yes |
Event | 27th IEEE Annual Northeast Bioengineering Conference - Storrs, CT, United States Duration: Mar 31 2001 → Apr 1 2001 |
ASJC Scopus subject areas
- General Chemical Engineering