Projecting two-axis nanometer scale displacement of microscopic beads onto a quadrant photodetector with a laser beam

Daqun Li, Bruce Schnapp

Research output: Contribution to journalArticle

Abstract

A quadrant photodetector has been added onto a custom differential interference contrast microscope to measure two-axis displacement of silica beads with a noise ≤s0.1 nm/√Hz below 150 Hz. A diode-pumped solid-state laser is incorporated to function not only as a light source for displacement detection but also as an optical trap for motility studies of protein motors. This system is designed for studies in which the motility needs to be simultaneously monitored along both axes at nm accuracy.

Original languageEnglish (US)
Pages (from-to)3920-3921
Number of pages2
JournalReview of Scientific Instruments
Volume68
Issue number10
StatePublished - Oct 1997
Externally publishedYes

Fingerprint

locomotion
Solid state lasers
quadrants
Photodetectors
beads
Laser beams
photometers
Light sources
Diodes
Microscopes
Silica
laser beams
Proteins
solid state lasers
light sources
diodes
microscopes
traps
silicon dioxide
proteins

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Projecting two-axis nanometer scale displacement of microscopic beads onto a quadrant photodetector with a laser beam. / Li, Daqun; Schnapp, Bruce.

In: Review of Scientific Instruments, Vol. 68, No. 10, 10.1997, p. 3920-3921.

Research output: Contribution to journalArticle

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