Profilometer variance in implant roughness characterization

Sean Kohles, Melissa B. Clark, Christopher A. Brown, James N. Kenealy

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Instrument-dependencies associated with the variation in measured surface roughness parameters were studied. Repeated measurements of average roughness (Ra) were taken to compare instrument accuracy and precision over a range of surface operations. Results show that surface treatment and instrument strongly influence roughness measurements.

Original languageEnglish (US)
JournalAnnals of Biomedical Engineering
Volume28
Issue numberSUPPL. 1
StatePublished - 2000
Externally publishedYes

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Surface roughness
Roughness measurement
Surface treatment

ASJC Scopus subject areas

  • Biomedical Engineering

Cite this

Kohles, S., Clark, M. B., Brown, C. A., & Kenealy, J. N. (2000). Profilometer variance in implant roughness characterization. Annals of Biomedical Engineering, 28(SUPPL. 1).

Profilometer variance in implant roughness characterization. / Kohles, Sean; Clark, Melissa B.; Brown, Christopher A.; Kenealy, James N.

In: Annals of Biomedical Engineering, Vol. 28, No. SUPPL. 1, 2000.

Research output: Contribution to journalArticle

Kohles, S, Clark, MB, Brown, CA & Kenealy, JN 2000, 'Profilometer variance in implant roughness characterization', Annals of Biomedical Engineering, vol. 28, no. SUPPL. 1.
Kohles S, Clark MB, Brown CA, Kenealy JN. Profilometer variance in implant roughness characterization. Annals of Biomedical Engineering. 2000;28(SUPPL. 1).
Kohles, Sean ; Clark, Melissa B. ; Brown, Christopher A. ; Kenealy, James N. / Profilometer variance in implant roughness characterization. In: Annals of Biomedical Engineering. 2000 ; Vol. 28, No. SUPPL. 1.
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