Profilometer variance in implant roughness characterization

Sean S. Kohles, Melissa B. Clark, Christopher A. Brown, James N. Kenealy

Research output: Contribution to journalConference article

1 Scopus citations

Abstract

Instrument-dependencies associated with the variation in measured surface roughness parameters were studied. Repeated measurements of average roughness (Ra) were taken to compare instrument accuracy and precision over a range of surface operations. Results show that surface treatment and instrument strongly influence roughness measurements.

Original languageEnglish (US)
Pages (from-to)S-17
JournalAnnals of Biomedical Engineering
Volume28
Issue numberSUPPL. 1
StatePublished - Dec 1 2000
Event2000 Annual Fall Meeting of the Biomedical Engineering Society - Washington, WA, USA
Duration: Oct 12 2000Oct 14 2000

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ASJC Scopus subject areas

  • Biomedical Engineering

Cite this

Kohles, S. S., Clark, M. B., Brown, C. A., & Kenealy, J. N. (2000). Profilometer variance in implant roughness characterization. Annals of Biomedical Engineering, 28(SUPPL. 1), S-17.