Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

Lihong Wang, Shao pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth M. Mammini, Ward IV Small, Luiz B. Da Silva

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

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Physics & Astronomy

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