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Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters
Lihong Wang, Shao pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth M. Mammini, Ward IV Small, Luiz B. Da Silva
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Scopus
citations