Improved nm displacement detector for microscopic beads at frequencies below 10 Hz

Daqun Li, Bruce Schnapp

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples.

Original languageEnglish (US)
Pages (from-to)2195-2199
Number of pages5
JournalReview of Scientific Instruments
Volume68
Issue number5
StatePublished - May 1997
Externally publishedYes

Fingerprint

Laser interferometry
beads
Microscopes
Detectors
laser interferometry
Lasers
detectors
preserving
rods
Experiments
microscopes
traps
low frequencies
interference
lasers

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Improved nm displacement detector for microscopic beads at frequencies below 10 Hz. / Li, Daqun; Schnapp, Bruce.

In: Review of Scientific Instruments, Vol. 68, No. 5, 05.1997, p. 2195-2199.

Research output: Contribution to journalArticle

@article{fb4b19a8198c46f9a9fff512dd44cdfd,
title = "Improved nm displacement detector for microscopic beads at frequencies below 10 Hz",
abstract = "A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples.",
author = "Daqun Li and Bruce Schnapp",
year = "1997",
month = "5",
language = "English (US)",
volume = "68",
pages = "2195--2199",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "5",

}

TY - JOUR

T1 - Improved nm displacement detector for microscopic beads at frequencies below 10 Hz

AU - Li, Daqun

AU - Schnapp, Bruce

PY - 1997/5

Y1 - 1997/5

N2 - A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples.

AB - A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples.

UR - http://www.scopus.com/inward/record.url?scp=0041525640&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0041525640&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0041525640

VL - 68

SP - 2195

EP - 2199

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 5

ER -