Improved nm displacement detector for microscopic beads at frequencies below 10 Hz

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4 Scopus citations

Abstract

A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples.

Original languageEnglish (US)
Pages (from-to)2195-2199
Number of pages5
JournalReview of Scientific Instruments
Volume68
Issue number5
DOIs
StatePublished - May 1997

ASJC Scopus subject areas

  • Instrumentation

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