Ga+ FIB milling and measurement of FIB damage in sapphire

Brandon Van Leer, Huikai Cheng, Jessica McQuiston

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)346-347
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Jan 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

Fingerprint

Sapphire
sapphire
damage

ASJC Scopus subject areas

  • Instrumentation

Cite this

Ga+ FIB milling and measurement of FIB damage in sapphire. / Van Leer, Brandon; Cheng, Huikai; McQuiston, Jessica.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.01.2014, p. 346-347.

Research output: Contribution to journalConference article

Van Leer, Brandon ; Cheng, Huikai ; McQuiston, Jessica. / Ga+ FIB milling and measurement of FIB damage in sapphire. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 346-347.
@article{adf97e6a250e4cbbbdda8bd7e27cf114,
title = "Ga+ FIB milling and measurement of FIB damage in sapphire",
author = "{Van Leer}, Brandon and Huikai Cheng and Jessica McQuiston",
year = "2014",
month = "1",
day = "1",
doi = "10.1017/S1431927614003456",
language = "English (US)",
volume = "20",
pages = "346--347",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "3",

}

TY - JOUR

T1 - Ga+ FIB milling and measurement of FIB damage in sapphire

AU - Van Leer, Brandon

AU - Cheng, Huikai

AU - McQuiston, Jessica

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84927947276&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927947276&partnerID=8YFLogxK

U2 - 10.1017/S1431927614003456

DO - 10.1017/S1431927614003456

M3 - Conference article

AN - SCOPUS:84927947276

VL - 20

SP - 346

EP - 347

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -