Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors

Xuezhe Zheng, Philippe J. Marchand, Dawei Huang, Osman Kibar, Sadik Esener

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

A diffraction-based beam-propagation model is used to study optical cross talk in microbeam free-space optical interconnection (FSOI) systems. The system consists of VCSEL's, microlenses, and metal-semiconductor-metal (MSM) detectors, with the detectors modeled as amplitude gratings with low contrast ratio (based on experimental results). Different possible cross-talk sources are studied. Results show that, in an optimized system, the cross talk caused by diffractive scattering is not an issue. However, in such systems the principal reflection from a MSM detector surface creates two problems: VCSEL coupling and ghost talk. The coupling of the reflected beam into the VCSEL's may cause power oscillation (and increase the bit error rate), whereas ghost talk will limit the distance-bandwidth product of the interconnect system. This optical system is also abstracted in HSPICE together with the laser driver and receiver circuits to analyze ghost talk in this system. Results show that at high speed (1 Gbit/s or more) these effects negatively affect system performance.

Original languageEnglish (US)
Pages (from-to)4834-4841
Number of pages8
JournalApplied Optics
Volume39
Issue number26
StatePublished - Sep 10 2000
Externally publishedYes

Fingerprint

free-space optical interconnects
Metal detectors
Microlenses
Semiconductor detectors
Optical interconnects
microbeams
Surface emitting lasers
ghosts
surface emitting lasers
cavities
detectors
Metals
metals
Optical systems
Bit error rate
bit error rate
Diffraction
Scattering
Detectors
Bandwidth

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors. / Zheng, Xuezhe; Marchand, Philippe J.; Huang, Dawei; Kibar, Osman; Esener, Sadik.

In: Applied Optics, Vol. 39, No. 26, 10.09.2000, p. 4834-4841.

Research output: Contribution to journalArticle

@article{ca689619fba644f993a818d4f5a49f15,
title = "Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors",
abstract = "A diffraction-based beam-propagation model is used to study optical cross talk in microbeam free-space optical interconnection (FSOI) systems. The system consists of VCSEL's, microlenses, and metal-semiconductor-metal (MSM) detectors, with the detectors modeled as amplitude gratings with low contrast ratio (based on experimental results). Different possible cross-talk sources are studied. Results show that, in an optimized system, the cross talk caused by diffractive scattering is not an issue. However, in such systems the principal reflection from a MSM detector surface creates two problems: VCSEL coupling and ghost talk. The coupling of the reflected beam into the VCSEL's may cause power oscillation (and increase the bit error rate), whereas ghost talk will limit the distance-bandwidth product of the interconnect system. This optical system is also abstracted in HSPICE together with the laser driver and receiver circuits to analyze ghost talk in this system. Results show that at high speed (1 Gbit/s or more) these effects negatively affect system performance.",
author = "Xuezhe Zheng and Marchand, {Philippe J.} and Dawei Huang and Osman Kibar and Sadik Esener",
year = "2000",
month = "9",
day = "10",
language = "English (US)",
volume = "39",
pages = "4834--4841",
journal = "Applied Optics",
issn = "0003-6935",
publisher = "The Optical Society",
number = "26",

}

TY - JOUR

T1 - Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors

AU - Zheng, Xuezhe

AU - Marchand, Philippe J.

AU - Huang, Dawei

AU - Kibar, Osman

AU - Esener, Sadik

PY - 2000/9/10

Y1 - 2000/9/10

N2 - A diffraction-based beam-propagation model is used to study optical cross talk in microbeam free-space optical interconnection (FSOI) systems. The system consists of VCSEL's, microlenses, and metal-semiconductor-metal (MSM) detectors, with the detectors modeled as amplitude gratings with low contrast ratio (based on experimental results). Different possible cross-talk sources are studied. Results show that, in an optimized system, the cross talk caused by diffractive scattering is not an issue. However, in such systems the principal reflection from a MSM detector surface creates two problems: VCSEL coupling and ghost talk. The coupling of the reflected beam into the VCSEL's may cause power oscillation (and increase the bit error rate), whereas ghost talk will limit the distance-bandwidth product of the interconnect system. This optical system is also abstracted in HSPICE together with the laser driver and receiver circuits to analyze ghost talk in this system. Results show that at high speed (1 Gbit/s or more) these effects negatively affect system performance.

AB - A diffraction-based beam-propagation model is used to study optical cross talk in microbeam free-space optical interconnection (FSOI) systems. The system consists of VCSEL's, microlenses, and metal-semiconductor-metal (MSM) detectors, with the detectors modeled as amplitude gratings with low contrast ratio (based on experimental results). Different possible cross-talk sources are studied. Results show that, in an optimized system, the cross talk caused by diffractive scattering is not an issue. However, in such systems the principal reflection from a MSM detector surface creates two problems: VCSEL coupling and ghost talk. The coupling of the reflected beam into the VCSEL's may cause power oscillation (and increase the bit error rate), whereas ghost talk will limit the distance-bandwidth product of the interconnect system. This optical system is also abstracted in HSPICE together with the laser driver and receiver circuits to analyze ghost talk in this system. Results show that at high speed (1 Gbit/s or more) these effects negatively affect system performance.

UR - http://www.scopus.com/inward/record.url?scp=0008410222&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0008410222&partnerID=8YFLogxK

M3 - Article

C2 - 18350076

AN - SCOPUS:0008410222

VL - 39

SP - 4834

EP - 4841

JO - Applied Optics

JF - Applied Optics

SN - 0003-6935

IS - 26

ER -