Studying trapped grains in alumina using SEM and EBSD

J. L. Riesterer, J. K. Farrer, N. Ravishankar, C. B. Carter

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1020-1021
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2006

ASJC Scopus subject areas

  • Instrumentation

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