A reflectance confocal scanning laser microscope (rCSLM) operating at 488-nm wavelength imaged three types of optical phantoms: (1) 100-nm-dia. polystyrene microspheres in gel at 2% volume fraction, (2) solid polyurethane phantoms (INO Biomimic™), and (3) common reflectance standards (Spectralon™). The noninvasive method measured the exponential decay of reflected signal as the focus (zf) moved deeper into the material. The two experimental values, the attenuation coefficient μ and the pre-exponential factor ρ, were mapped into the material optical scattering properties, the scattering coefficient μs and the anisotropy of scattering g. Results show that μs varies as 58, 8-24, and 130-200 cm-1 for phantom types (1), (2) and (3), respectively. The g varies as 0.112, 0.53-0.67, and 0.003-0.26, respectively.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics