Planar prism spectrometer based on adiabatically connected waveguiding slabs

F. Civitci, M. Hammer, H. J.W.M. Hoekstra

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The device principle of a prism-based on-chip spectrometer for TE polarization is introduced. The spectrometer exploits the modal dispersion in planar waveguides in a layout with slab regions having two different thicknesses of the guiding layer. The set-up uses parabolic mirrors, for the collimation of light of the input waveguide and focusing of the light to the receiver waveguides, which relies on total internal reflection at the interface between two such regions. These regions are connected adiabatically to prevent unwanted mode conversion and loss at the edges of the prism. The structure can be fabricated with two wet etching steps. The paper presents basic theory and a general approach for device optimization. The latter is illustrated with a numerical example assuming SiON technology.

Original languageEnglish (US)
Pages (from-to)29-37
Number of pages9
JournalOptics Communications
Volume365
DOIs
StatePublished - Apr 15 2016
Externally publishedYes

Keywords

  • Goos Hänchen shift
  • Integrated Optics
  • Optical imaging
  • Optical waveguides
  • Prism spectrometers
  • Total internal reflection mirrors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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