Ga+ Ions and Xe+ plasma: Complementary FIBs for resin-embedded life science sample analyses

Jessica McQuiston, Ron Kelley

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)332-333
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Jan 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

Fingerprint

life sciences
resins
Resins
Plasmas
Ions
ions

ASJC Scopus subject areas

  • Instrumentation

Cite this

Ga+ Ions and Xe+ plasma : Complementary FIBs for resin-embedded life science sample analyses. / McQuiston, Jessica; Kelley, Ron.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.01.2014, p. 332-333.

Research output: Contribution to journalConference article

@article{733554a89e374a2985a4451ca5cb91a1,
title = "Ga+ Ions and Xe+ plasma: Complementary FIBs for resin-embedded life science sample analyses",
author = "Jessica McQuiston and Ron Kelley",
year = "2014",
month = "1",
day = "1",
doi = "10.1017/S1431927614003389",
language = "English (US)",
volume = "20",
pages = "332--333",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "3",

}

TY - JOUR

T1 - Ga+ Ions and Xe+ plasma

T2 - Complementary FIBs for resin-embedded life science sample analyses

AU - McQuiston, Jessica

AU - Kelley, Ron

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84927922275&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927922275&partnerID=8YFLogxK

U2 - 10.1017/S1431927614003389

DO - 10.1017/S1431927614003389

M3 - Conference article

AN - SCOPUS:84927922275

VL - 20

SP - 332

EP - 333

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -