The spatial signal-to-noise ratio (SNR) obtained for each data plane upon readout, which is dependent on the variation of the individual bit's signal levels was investigated. The absolute signal strength was determined by the media doping concentration and 2-photon recording level, readout laser power, media fluorescence efficiency, and the detector collection efficiency and integration time. Random errors were introduced by defects in the media, and scattering of the beams by internal and surface defects/dusts, and by the recorded bits. There are 493 errors out of 960,400 measured bits, which are mostly due to small scratches and dust particles on the surface. This indicates a potential impact on sample fabrication improvements.
|Original language||English (US)|
|Number of pages||2|
|Publication status||Published - 1996|
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering