Abstract
The spatial signal-to-noise ratio (SNR) obtained for each data plane upon readout, which is dependent on the variation of the individual bit's signal levels was investigated. The absolute signal strength was determined by the media doping concentration and 2-photon recording level, readout laser power, media fluorescence efficiency, and the detector collection efficiency and integration time. Random errors were introduced by defects in the media, and scattering of the beams by internal and surface defects/dusts, and by the recorded bits. There are 493 errors out of 960,400 measured bits, which are mostly due to small scratches and dust particles on the surface. This indicates a potential impact on sample fabrication improvements.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 137-138 |
| Number of pages | 2 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 1 |
| State | Published - 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1996 9th Annual Meeting of IEEE Lasers and Electro-Optics Society, LEOS'96. Part 1 (of 2) - Boston, MA, USA Duration: Nov 18 1996 → Nov 19 1996 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering