Device testing for the development of an HBT IC process

S. Diamond, S. J. Prasad, J. Ebner, G. Pubanz, B. Vetanen, C. Haynes, S. Park, I. Beers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Device testing for the development of an HBT IC process'. Together they form a unique fingerprint.

Engineering & Materials Science