Cryomesh™: A new substrate for cryo-electron microscopy

Craig Yoshioka, Bridget Carragher, Clinton S. Potter

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Here we evaluate a new grid substrate developed by ProtoChips Inc. (Raleigh, NC) for cryo-transmission electron microscopy. The new grids are fabricated from doped silicon carbide using processes adapted from the semiconductor industry. A major motivating purpose in the development of these grids was to increase the low-temperature conductivity of the substrate, a characteristic that is thought to affect the appearance of beam-induced movement (BIM) in transmission electron microscope (TEM) images of biological specimens. BIM degrades the quality of data and is especially severe when frozen biological specimens are tilted in the microscope. Our results show that this new substrate does indeed have a significant impact on reducing the appearance and severity of beam-induced movement in TEM images of tilted cryo-preserved samples. Furthermore, while we have not been able to ascertain the exact causes underlying the BIM phenomenon, we have evidence that the rigidity and flatness of these grids may play a major role in its reduction. This improvement in the reliability of imaging at tilt has a significant impact on using data collection methods such as random conical tilt or orthogonal tilt reconstruction with cryo-preserved samples. Reduction in BIM also has the potential for improving the resolution of three-dimensional cryo-reconstructions in general.

Original languageEnglish (US)
Pages (from-to)43-53
Number of pages11
JournalMicroscopy and Microanalysis
Volume16
Issue number1
DOIs
StatePublished - Feb 2010
Externally publishedYes

Fingerprint

Electron microscopy
electron microscopy
grids
Electron microscopes
Substrates
Silicon carbide
Rigidity
electron microscopes
Microscopes
Semiconductor materials
Transmission electron microscopy
Imaging techniques
flatness
rigidity
silicon carbides
industries
microscopes
Industry
conductivity
transmission electron microscopy

Keywords

  • Beam-induced movement
  • Charging
  • Cryo-electron microscopy
  • Grid substrates
  • OTR
  • RCT
  • TEM

ASJC Scopus subject areas

  • Instrumentation

Cite this

Cryomesh™ : A new substrate for cryo-electron microscopy. / Yoshioka, Craig; Carragher, Bridget; Potter, Clinton S.

In: Microscopy and Microanalysis, Vol. 16, No. 1, 02.2010, p. 43-53.

Research output: Contribution to journalArticle

Yoshioka, Craig ; Carragher, Bridget ; Potter, Clinton S. / Cryomesh™ : A new substrate for cryo-electron microscopy. In: Microscopy and Microanalysis. 2010 ; Vol. 16, No. 1. pp. 43-53.
@article{04053bd615484eb49dd0ba01557d0377,
title = "Cryomesh™: A new substrate for cryo-electron microscopy",
abstract = "Here we evaluate a new grid substrate developed by ProtoChips Inc. (Raleigh, NC) for cryo-transmission electron microscopy. The new grids are fabricated from doped silicon carbide using processes adapted from the semiconductor industry. A major motivating purpose in the development of these grids was to increase the low-temperature conductivity of the substrate, a characteristic that is thought to affect the appearance of beam-induced movement (BIM) in transmission electron microscope (TEM) images of biological specimens. BIM degrades the quality of data and is especially severe when frozen biological specimens are tilted in the microscope. Our results show that this new substrate does indeed have a significant impact on reducing the appearance and severity of beam-induced movement in TEM images of tilted cryo-preserved samples. Furthermore, while we have not been able to ascertain the exact causes underlying the BIM phenomenon, we have evidence that the rigidity and flatness of these grids may play a major role in its reduction. This improvement in the reliability of imaging at tilt has a significant impact on using data collection methods such as random conical tilt or orthogonal tilt reconstruction with cryo-preserved samples. Reduction in BIM also has the potential for improving the resolution of three-dimensional cryo-reconstructions in general.",
keywords = "Beam-induced movement, Charging, Cryo-electron microscopy, Grid substrates, OTR, RCT, TEM",
author = "Craig Yoshioka and Bridget Carragher and Potter, {Clinton S.}",
year = "2010",
month = "2",
doi = "10.1017/S1431927609991310",
language = "English (US)",
volume = "16",
pages = "43--53",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",

}

TY - JOUR

T1 - Cryomesh™

T2 - A new substrate for cryo-electron microscopy

AU - Yoshioka, Craig

AU - Carragher, Bridget

AU - Potter, Clinton S.

PY - 2010/2

Y1 - 2010/2

N2 - Here we evaluate a new grid substrate developed by ProtoChips Inc. (Raleigh, NC) for cryo-transmission electron microscopy. The new grids are fabricated from doped silicon carbide using processes adapted from the semiconductor industry. A major motivating purpose in the development of these grids was to increase the low-temperature conductivity of the substrate, a characteristic that is thought to affect the appearance of beam-induced movement (BIM) in transmission electron microscope (TEM) images of biological specimens. BIM degrades the quality of data and is especially severe when frozen biological specimens are tilted in the microscope. Our results show that this new substrate does indeed have a significant impact on reducing the appearance and severity of beam-induced movement in TEM images of tilted cryo-preserved samples. Furthermore, while we have not been able to ascertain the exact causes underlying the BIM phenomenon, we have evidence that the rigidity and flatness of these grids may play a major role in its reduction. This improvement in the reliability of imaging at tilt has a significant impact on using data collection methods such as random conical tilt or orthogonal tilt reconstruction with cryo-preserved samples. Reduction in BIM also has the potential for improving the resolution of three-dimensional cryo-reconstructions in general.

AB - Here we evaluate a new grid substrate developed by ProtoChips Inc. (Raleigh, NC) for cryo-transmission electron microscopy. The new grids are fabricated from doped silicon carbide using processes adapted from the semiconductor industry. A major motivating purpose in the development of these grids was to increase the low-temperature conductivity of the substrate, a characteristic that is thought to affect the appearance of beam-induced movement (BIM) in transmission electron microscope (TEM) images of biological specimens. BIM degrades the quality of data and is especially severe when frozen biological specimens are tilted in the microscope. Our results show that this new substrate does indeed have a significant impact on reducing the appearance and severity of beam-induced movement in TEM images of tilted cryo-preserved samples. Furthermore, while we have not been able to ascertain the exact causes underlying the BIM phenomenon, we have evidence that the rigidity and flatness of these grids may play a major role in its reduction. This improvement in the reliability of imaging at tilt has a significant impact on using data collection methods such as random conical tilt or orthogonal tilt reconstruction with cryo-preserved samples. Reduction in BIM also has the potential for improving the resolution of three-dimensional cryo-reconstructions in general.

KW - Beam-induced movement

KW - Charging

KW - Cryo-electron microscopy

KW - Grid substrates

KW - OTR

KW - RCT

KW - TEM

UR - http://www.scopus.com/inward/record.url?scp=77952507558&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77952507558&partnerID=8YFLogxK

U2 - 10.1017/S1431927609991310

DO - 10.1017/S1431927609991310

M3 - Article

C2 - 20082728

AN - SCOPUS:77952507558

VL - 16

SP - 43

EP - 53

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 1

ER -