An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations

James K. Lingwood, Nathalie Nève, Sean Kohles, Derek C. Tretheway

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A novel instrument has been developed (μPIVOT) to manipulate and characterize the mechanical environment in and around microscale objects by integrating two laser-based techniques: micron-resolution particle image velocimetry (μPIV) and optical tweezers (OT). While the μPIVOT enables a new realm of microscale studies, it still maintains the individual capabilities of each optical technique. Ongoing investigations will provide a unique perspective towards understanding microscale phenomena including cell biomechanics, non-Newtonian fluid flow, and single particle or particle-particle hydrodynamics.

Original languageEnglish (US)
Title of host publicationASME International Mechanical Engineering Congress and Exposition, Proceedings
Pages835-838
Number of pages4
Volume11 PART B
StatePublished - 2008
Externally publishedYes
EventASME International Mechanical Engineering Congress and Exposition, IMECE 2007 - Seattle, WA, United States
Duration: Nov 11 2007Nov 15 2007

Other

OtherASME International Mechanical Engineering Congress and Exposition, IMECE 2007
CountryUnited States
CitySeattle, WA
Period11/11/0711/15/07

Fingerprint

Optical tweezers
Velocimeters
Biomechanics
Velocity measurement
Flow of fluids
Hydrodynamics
Lasers

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Lingwood, J. K., Nève, N., Kohles, S., & Tretheway, D. C. (2008). An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations. In ASME International Mechanical Engineering Congress and Exposition, Proceedings (Vol. 11 PART B, pp. 835-838)

An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations. / Lingwood, James K.; Nève, Nathalie; Kohles, Sean; Tretheway, Derek C.

ASME International Mechanical Engineering Congress and Exposition, Proceedings. Vol. 11 PART B 2008. p. 835-838.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lingwood, JK, Nève, N, Kohles, S & Tretheway, DC 2008, An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations. in ASME International Mechanical Engineering Congress and Exposition, Proceedings. vol. 11 PART B, pp. 835-838, ASME International Mechanical Engineering Congress and Exposition, IMECE 2007, Seattle, WA, United States, 11/11/07.
Lingwood JK, Nève N, Kohles S, Tretheway DC. An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations. In ASME International Mechanical Engineering Congress and Exposition, Proceedings. Vol. 11 PART B. 2008. p. 835-838
Lingwood, James K. ; Nève, Nathalie ; Kohles, Sean ; Tretheway, Derek C. / An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations. ASME International Mechanical Engineering Congress and Exposition, Proceedings. Vol. 11 PART B 2008. pp. 835-838
@inproceedings{9c643a1d82644ff09238fd6ef367a265,
title = "An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations",
abstract = "A novel instrument has been developed (μPIVOT) to manipulate and characterize the mechanical environment in and around microscale objects by integrating two laser-based techniques: micron-resolution particle image velocimetry (μPIV) and optical tweezers (OT). While the μPIVOT enables a new realm of microscale studies, it still maintains the individual capabilities of each optical technique. Ongoing investigations will provide a unique perspective towards understanding microscale phenomena including cell biomechanics, non-Newtonian fluid flow, and single particle or particle-particle hydrodynamics.",
author = "Lingwood, {James K.} and Nathalie N{\`e}ve and Sean Kohles and Tretheway, {Derek C.}",
year = "2008",
language = "English (US)",
isbn = "079184305X",
volume = "11 PART B",
pages = "835--838",
booktitle = "ASME International Mechanical Engineering Congress and Exposition, Proceedings",

}

TY - GEN

T1 - An integrated micron-resolution particle image velocimeter/optical tweezers (μPIVOT) for microenvironment investigations

AU - Lingwood, James K.

AU - Nève, Nathalie

AU - Kohles, Sean

AU - Tretheway, Derek C.

PY - 2008

Y1 - 2008

N2 - A novel instrument has been developed (μPIVOT) to manipulate and characterize the mechanical environment in and around microscale objects by integrating two laser-based techniques: micron-resolution particle image velocimetry (μPIV) and optical tweezers (OT). While the μPIVOT enables a new realm of microscale studies, it still maintains the individual capabilities of each optical technique. Ongoing investigations will provide a unique perspective towards understanding microscale phenomena including cell biomechanics, non-Newtonian fluid flow, and single particle or particle-particle hydrodynamics.

AB - A novel instrument has been developed (μPIVOT) to manipulate and characterize the mechanical environment in and around microscale objects by integrating two laser-based techniques: micron-resolution particle image velocimetry (μPIV) and optical tweezers (OT). While the μPIVOT enables a new realm of microscale studies, it still maintains the individual capabilities of each optical technique. Ongoing investigations will provide a unique perspective towards understanding microscale phenomena including cell biomechanics, non-Newtonian fluid flow, and single particle or particle-particle hydrodynamics.

UR - http://www.scopus.com/inward/record.url?scp=44349102443&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=44349102443&partnerID=8YFLogxK

M3 - Conference contribution

SN - 079184305X

SN - 9780791843055

VL - 11 PART B

SP - 835

EP - 838

BT - ASME International Mechanical Engineering Congress and Exposition, Proceedings

ER -